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|Title:||Properties of the CdTe/InSb interface studied by optical and surface analytical techniques||Authors:||Feng, Z.C.
|Issue Date:||Jul-2006||Citation:||Feng, Z.C., Hung, S.Y., Wee, A.T.S. (2006-07). Properties of the CdTe/InSb interface studied by optical and surface analytical techniques. Physica Status Solidi (A) Applications and Materials Science 203 (9) : 2181-2185. ScholarBank@NUS Repository. https://doi.org/10.1002/pssa.200566013||Abstract:||Indium interdiffusion in-MBE-grown CdTe/InSb heterostructures was studied by optical and surface techniques of photoluminescence (PL), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS). A correlation between the two types of investigations is established. © 2006 WILEY-VCH Verlag GmbH & Co. KGaA.||Source Title:||Physica Status Solidi (A) Applications and Materials Science||URI:||http://scholarbank.nus.edu.sg/handle/10635/98846||ISSN:||18626300||DOI:||10.1002/pssa.200566013|
|Appears in Collections:||Staff Publications|
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