Please use this identifier to cite or link to this item:
|dc.title||Degradation effect of a ZnO layer on ZnS: Comparison between a Monte Carlo simulation and experimental Auger and CL measurements|
|dc.identifier.citation||Dong, G., Liangzhen, C., Rong, L., Wee, A.T.S. (2001-08). Degradation effect of a ZnO layer on ZnS: Comparison between a Monte Carlo simulation and experimental Auger and CL measurements. Surface and Interface Analysis 32 (1) : 84-87. ScholarBank@NUS Repository. https://doi.org/10.1002/sia.1011|
|dc.description.abstract||Surface reactions occur on the ZnS:Cu,Al,Au surface during prolonged electron bombardment forming a non-luminescent ZnO layer with consequent loss in cathodoluminescence (CL) intensity. The layer is formed according to the electron-stimulated surface chemical reaction (ESSCR) mechanism. There is a direct correlation between the power emitted as luminescence and the energy loss of the electron beam. The electron energy loss within the ZnS was determined by using the Monte Carlo algorithm CASINO, which is a publicly available code. By determining the energy loss, the influence of a non-luminescent ZnO layer of varying thickness on a ZnS substrate on the CL intensity was simulated. These results were compared also with previous calculations that were based on the results of experiments done on the transmission of electrons through thin films. The energy loss within the ZnS as function of the ZnO thickness was determined at beam voltages of 1, 2 and 5 keV. The results obtained correlate with experimental CL measurements of the phosphor degradation during electron bombardment. Copyright © 2001 John Wiley & Sons, Ltd.|
|dc.subject||Monte Carlo simulation|
|dc.description.sourcetitle||Surface and Interface Analysis|
|Appears in Collections:||Staff Publications|
Show simple item record
Files in This Item:
There are no files associated with this item.
checked on Apr 10, 2021
WEB OF SCIENCETM
checked on Apr 2, 2021
checked on Apr 11, 2021
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.