Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.607273
DC FieldValue
dc.titleBallistic emission spectroscopy and imaging of a buried metal-organic interface
dc.contributor.authorChandrasekhar, N.
dc.contributor.authorTroadec, C.
dc.contributor.authorKunardi, L.
dc.date.accessioned2014-10-16T09:49:38Z
dc.date.available2014-10-16T09:49:38Z
dc.date.issued2005
dc.identifier.citationChandrasekhar, N., Troadec, C., Kunardi, L. (2005). Ballistic emission spectroscopy and imaging of a buried metal-organic interface. Proceedings of SPIE - The International Society for Optical Engineering 5774 : 43-47. ScholarBank@NUS Repository. https://doi.org/10.1117/12.607273
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/98641
dc.description.abstractMetal organic interfaces have been under intensive scientific investigation over the past few years with the objective of improving devices based on organic materials. In this study, we report the first results on spectroscopy and imaging of a buried metal-organic interface using ballistic electron emission microscopy (BEEM). Unlike photoexcitation-based experiments, which typically average over large interfacial areas, BEEM enables direct observation of local interface band structure with nanometer resolution. The interface of silver (Ag) - polyparaphenylene (PPP, a blue emitter with high photoluminescence efficiency) is investigated. Multiple injection barriers and spatial non-uniformity of carrier injection are observed. Possible causes for these features will be discussed. The BEEM current images are found to correlate marginally with the surface topography of the silver film.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.607273
dc.sourceScopus
dc.subjectBEEM
dc.subjectCarrier injection
dc.subjectInterface
dc.subjectSchottky barrier
dc.subjectSTM
dc.typeConference Paper
dc.contributor.departmentPHYSICS
dc.description.doi10.1117/12.607273
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume5774
dc.description.page43-47
dc.description.codenPSISD
dc.identifier.isiut000226292200009
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