Please use this identifier to cite or link to this item: https://doi.org/10.1109/NANOEL.2006.1609710
DC FieldValue
dc.titleBallistic electron microscopy of a metal molecule interface
dc.contributor.authorKunardi, L.
dc.contributor.authorYi, Z.
dc.contributor.authorTroadec, C.
dc.contributor.authorLwin, M.H.T.
dc.contributor.authorKnoll, W.
dc.contributor.authorChandrasekhar, N.
dc.date.accessioned2014-10-16T09:49:38Z
dc.date.available2014-10-16T09:49:38Z
dc.date.issued2006
dc.identifier.citationKunardi, L., Yi, Z., Troadec, C., Lwin, M.H.T., Knoll, W., Chandrasekhar, N. (2006). Ballistic electron microscopy of a metal molecule interface. NanoSingapore 2006: IEEE Conference on Emerging Technologies - Nanoelectronics - Proceedings 2006 : 194-196. ScholarBank@NUS Repository. https://doi.org/10.1109/NANOEL.2006.1609710
dc.identifier.isbn0780393589
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/98640
dc.description.abstractWe present studies on a Ag/ HS-(CH2)4-T3-H (T3C4SH)/ Au diode using nanometer scale resolution, ballistic electron emission microscopy (BEEM). Images show spatially non-uniform carrier injection. A WKB calculation is carried out and compared with the experimental data. The results indicate that molecular levels are being accessed in the BEEM experiment, since the measured currents are larger than purely tunneling contribution. Our results are consistent with previously published results on a similar molecule [1]. Physical origins of the non-uniform carrier injection and its implications are discussed. © 2006 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/NANOEL.2006.1609710
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentPHYSICS
dc.description.doi10.1109/NANOEL.2006.1609710
dc.description.sourcetitleNanoSingapore 2006: IEEE Conference on Emerging Technologies - Nanoelectronics - Proceedings
dc.description.volume2006
dc.description.page194-196
dc.identifier.isiut000245207000040
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