Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.354780
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dc.titleVariation of trapping/detrapping properties as a function of the insulator size
dc.contributor.authorOh, K.H.
dc.contributor.authorOng, C.K.
dc.contributor.authorTan, B.T.G.
dc.contributor.authorGressus, C.L.
dc.contributor.authorBlaise, G.
dc.date.accessioned2014-10-16T09:48:24Z
dc.date.available2014-10-16T09:48:24Z
dc.date.issued1993
dc.identifier.citationOh, K.H., Ong, C.K., Tan, B.T.G., Gressus, C.L., Blaise, G. (1993). Variation of trapping/detrapping properties as a function of the insulator size. Journal of Applied Physics 74 (3) : 1960-1967. ScholarBank@NUS Repository. https://doi.org/10.1063/1.354780
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/98548
dc.description.abstractUsing the scanning electron microscope we have investigated the physical parameters determining the size effect of various dielectric samples submitted to a surface electric field. It is shown that the size effect is a function of the static permittivity and of the space charge distribution. The results are explained by the consideration of charge diffusion and polarization relaxation processes resulting from the space charge formation. A one-dimensional mathematical model has also been used to describe space charge distribution. The findings were consistent with the experimental observations.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.354780
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.354780
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume74
dc.description.issue3
dc.description.page1960-1967
dc.identifier.isiutA1993LQ12700077
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