Please use this identifier to cite or link to this item:
https://doi.org/10.1063/1.2937834
DC Field | Value | |
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dc.title | Thermal rectification at silicon-amorphous polyethylene interface | |
dc.contributor.author | Hu, M. | |
dc.contributor.author | Keblinski, P. | |
dc.contributor.author | Li, B. | |
dc.date.accessioned | 2014-10-16T09:46:12Z | |
dc.date.available | 2014-10-16T09:46:12Z | |
dc.date.issued | 2008 | |
dc.identifier.citation | Hu, M., Keblinski, P., Li, B. (2008). Thermal rectification at silicon-amorphous polyethylene interface. Applied Physics Letters 92 (21) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2937834 | |
dc.identifier.issn | 00036951 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/98363 | |
dc.description.abstract | Using nonequilibrium molecular dynamics simulations, we study the thermal diode effect in a system composed of inorganic crystal and amorphous polymer by imposing a series of positive and negative heat currents. We estimate that in the limit of large heat currents, the silicon-amorphous polyethylene interfacial thermal conductance is about 19.6 and 13.5 MW m2 K at room temperature for heat flowing from polymer to silicon and from silicon to polymer, respectively, which results in thermal rectification of up to 45%. Vibrational analysis indicates that the origin of thermal rectification is in the strong temperature dependence of the frequency spectra of the polymer. © 2008 American Institute of Physics. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.2937834 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | PHYSICS | |
dc.description.doi | 10.1063/1.2937834 | |
dc.description.sourcetitle | Applied Physics Letters | |
dc.description.volume | 92 | |
dc.description.issue | 21 | |
dc.description.page | - | |
dc.description.coden | APPLA | |
dc.identifier.isiut | 000256303500021 | |
Appears in Collections: | Staff Publications |
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