Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0009-2614(01)00308-6
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dc.titlePhotoluminescence studies of SiC nanocrystals embedded in a SiO2 matrix
dc.contributor.authorGuo, Y.P.
dc.contributor.authorZheng, J.C.
dc.contributor.authorWee, A.T.S.
dc.contributor.authorHuan, C.H.A.
dc.contributor.authorLi, K.
dc.contributor.authorPan, J.S.
dc.contributor.authorFeng, Z.C.
dc.contributor.authorChua, S.J.
dc.date.accessioned2014-10-16T09:36:28Z
dc.date.available2014-10-16T09:36:28Z
dc.date.issued2001-05-18
dc.identifier.citationGuo, Y.P., Zheng, J.C., Wee, A.T.S., Huan, C.H.A., Li, K., Pan, J.S., Feng, Z.C., Chua, S.J. (2001-05-18). Photoluminescence studies of SiC nanocrystals embedded in a SiO2 matrix. Chemical Physics Letters 339 (5-6) : 319-322. ScholarBank@NUS Repository. https://doi.org/10.1016/S0009-2614(01)00308-6
dc.identifier.issn00092614
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/97541
dc.description.abstractThe dependence of the photoluminescence (PL) from SiC nanocrystals embedded in a SiO2 matrix on annealing is presented. Blue-green PL has been observed at room temperature from annealed SiC-SiO2 composite films. The intensity of the single emission band at 460 nm (2.7 eV) shows a strong dependence on the annealing temperature. The combination of high-resolution transmission electron microscopy (HRTEM), Fourier transform infrared (FTIR) transmission spectra and PL results suggest that SiC nanocrystals have been incorporated into the SiO2 matrix and O-deficient defects were formed. The origin of luminescence is attributed to the creation of defects in silicon oxide. © 2001 Elsevier Science B.V.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/S0009-2614(01)00308-6
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1016/S0009-2614(01)00308-6
dc.description.sourcetitleChemical Physics Letters
dc.description.volume339
dc.description.issue5-6
dc.description.page319-322
dc.description.codenCHPLB
dc.identifier.isiut000168795500004
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