Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/97409
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dc.titleObservation of Many Coherent Oscillations for MeV Protons Transmitted through Stacking Faults
dc.contributor.authorBreese, M.B.H.
dc.contributor.authorTeo, E.J.
dc.contributor.authorRana, M.A.
dc.contributor.authorHuang, L.
dc.contributor.authorVan Kan, J.A.
dc.contributor.authorWatt, F.
dc.contributor.authorKing, P.J.C.
dc.date.accessioned2014-10-16T09:34:57Z
dc.date.available2014-10-16T09:34:57Z
dc.date.issued2004-01-30
dc.identifier.citationBreese, M.B.H.,Teo, E.J.,Rana, M.A.,Huang, L.,Van Kan, J.A.,Watt, F.,King, P.J.C. (2004-01-30). Observation of Many Coherent Oscillations for MeV Protons Transmitted through Stacking Faults. Physical Review Letters 92 (4) : 455031-455034. ScholarBank@NUS Repository.
dc.identifier.issn00319007
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/97409
dc.description.abstractThe study of coherent oscillations for 2 MeV protons transmitted through stacking faults in silicon was presented. The high spatial resolution, high-contrast ion channeling measurements of stacking faults resulted in the observation of long-range coherent planar oscillations. Up to ten periodic intensity oscillations were observed over a narrow range of beam tilts to the (011) planes. The behavior was characterized by using Monte Carlo simulations and a phase-space model of planar channeled ion interactions with stacking faults.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.sourcetitlePhysical Review Letters
dc.description.volume92
dc.description.issue4
dc.description.page455031-455034
dc.description.codenPRLTA
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

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