Observation of growth morphology in pulsed-laser deposited barium ferrite thin films

Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0169-4332(99)00100-2

Title:	Observation of growth morphology in pulsed-laser deposited barium ferrite thin films
Authors:	Zhang, X.Y. Ong, C.K. Xu, S.Y. Fang, H.C.
Issue Date:	Apr-1999
Citation:	Zhang, X.Y., Ong, C.K., Xu, S.Y., Fang, H.C. (1999-04). Observation of growth morphology in pulsed-laser deposited barium ferrite thin films. Applied Surface Science 143 (1) : 323-327. ScholarBank@NUS Repository. https://doi.org/10.1016/S0169-4332(99)00100-2
Abstract:	We observed for the first time a two-dimensional growth mode in the c-axis barium ferrite (BaM) thin film grown on (0001) sapphire substrate by pulsed-laser deposition. Both the X-ray diffraction analysis (XRD) and the surface morphology showed that the film had excellent crystalline structure with flat terraces and straight growth steps. Well-coalesced grains formed smooth film surface and resulted in unclear grain boundaries. Compared with the BaM thin film grown on (111) Si and (001) LiTaO3 substrates, we suggested that the BaM film obtained in this experiment had undergone a different growth mode. The magnetic data of the BaM thin film is also given.
Source Title:	Applied Surface Science
URI:	http://scholarbank.nus.edu.sg/handle/10635/97404
ISSN:	01694332
DOI:	10.1016/S0169-4332(99)00100-2
Appears in Collections:	Staff Publications

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