Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.4865122
DC FieldValue
dc.titleNote: Electrical detection and quantification of spin rectification effect enabled by shorted microstrip transmission line technique
dc.contributor.authorSoh, W.T.
dc.contributor.authorPeng, B.
dc.contributor.authorChai, G.
dc.contributor.authorOng, C.K.
dc.date.accessioned2014-10-16T09:34:23Z
dc.date.available2014-10-16T09:34:23Z
dc.date.issued2014-02
dc.identifier.citationSoh, W.T., Peng, B., Chai, G., Ong, C.K. (2014-02). Note: Electrical detection and quantification of spin rectification effect enabled by shorted microstrip transmission line technique. Review of Scientific Instruments 85 (2) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4865122
dc.identifier.issn00346748
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/97363
dc.description.abstractWe describe a shorted microstrip method for the sensitive quantification of Spin Rectification Effect (SRE). SRE for a Permalloy (Ni80Fe 20) thin film strip sputtered onto SiO2 substrate is demonstrated. Our method obviates the need for simultaneous lithographic patterning of the sample and transmission line, therefore greatly simplifying the SRE measurement process. Such a shorted microstrip method can allow different contributions to SRE (anisotropic magnetoresistance, Hall effect, and anomalous Hall effect) to be simultaneously determined. Furthermore, SRE signals from unpatterned 50 nm thick Permalloy films of area dimensions 5 mm × 10 mm can even be detected. © 2014 AIP Publishing LLC.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.4865122
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.4865122
dc.description.sourcetitleReview of Scientific Instruments
dc.description.volume85
dc.description.issue2
dc.description.page-
dc.description.codenRSINA
dc.identifier.isiut000335919900308
Appears in Collections:Staff Publications

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