Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0168-583X(99)00323-7
Title: New problems in nuclear microprobe analysis of materials
Authors: Jamieson, D.N.
Beckman, D.R.
Bettiol, A.A.
Laird, J.S.
Lee, K.K.
Prawer, S.
Saint, A.
Witham, L.C.G.
Yang, C. 
Issue Date: 1999
Citation: Jamieson, D.N., Beckman, D.R., Bettiol, A.A., Laird, J.S., Lee, K.K., Prawer, S., Saint, A., Witham, L.C.G., Yang, C. (1999). New problems in nuclear microprobe analysis of materials. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 158 (1) : 628-637. ScholarBank@NUS Repository. https://doi.org/10.1016/S0168-583X(99)00323-7
Abstract: Advanced materials are being evaluated for use as novel radiation detectors and microelectronic devices, including, potentially, synthetic diamond radiation-hard detectors for high-energy physics experiments and tissue equivalent dosimeters. Use of a nuclear microprobe has allowed spatially resolved electrical properties of the detector material to be measured. However quantitative analysis requires good models for charge collection mechanisms by ion beam induced charge (IBIC). In fact, nuclear microprobe analysis is playing an increasingly prominent role in the analysis of detector materials and devices by IBIC, with secondary roles also being played by ionoluminescence (IL) and the traditional techniques of Rutherford backscattering and particle induced X-ray emission. In this paper, many recent applications are reviewed and some examples of applications of the nuclear microprobe to the study of new materials and devices are presented. Some of these applications involve wide band gap materials, such as GaN, as well as novel detectors for radiation dosimetry in cancer therapy, photovoltaic devices and other microelectronic devices.
Source Title: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
URI: http://scholarbank.nus.edu.sg/handle/10635/97319
ISSN: 0168583X
DOI: 10.1016/S0168-583X(99)00323-7
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