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|Title:||Low-frequency noise in La0.7Sr0.3Mn1-xFexO3 thin films||Authors:||Han, K.-H.
|Issue Date:||8-Jul-2002||Citation:||Han, K.-H., Huang, Q., Ong, P.C., Ong, C.K. (2002-07-08). Low-frequency noise in La0.7Sr0.3Mn1-xFexO3 thin films. Journal of Physics Condensed Matter 14 (26) : 6619-6625. ScholarBank@NUS Repository. https://doi.org/10.1088/0953-8984/14/26/302||Abstract:||The low-frequency noise in epitaxial La0.7Sr0.3Mn1-xFexO3 thin films with x = 0, 0.08 and 0.12 has been studied as a function of magnetic field (up to 1500 G). At zero external magnetic field (B = 0 G), there is no appreciable peak in the normalized noise power spectral density (PSD) for x = 0 thin films; however, a peak does appear for x = 0.08 and 0.12 thin films near the metal-insulator transition temperature (Tp), which is below the Curie temperature. Unlike the resistivity, the noise PSD does not change with the doping level (x) at B = 0 G; however, at B = 1500 G the noise PSD decreases with x. At a low external magnetic field of B < 1500 G, there is no or a small thermal hysteresis in the noise PSD for all three differently doped samples; however, at B = 1500 G there appears a large thermal hysteresis for all samples. The contribution of magnetic domain fluctuations is a possible origin for the noise PSD.||Source Title:||Journal of Physics Condensed Matter||URI:||http://scholarbank.nus.edu.sg/handle/10635/97107||ISSN:||09538984||DOI:||10.1088/0953-8984/14/26/302|
|Appears in Collections:||Staff Publications|
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