Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3005879
DC FieldValue
dc.titleInfluence of Si concentration on the magnetization dynamics in as-sputtered FeCoSiN thin films at high frequencies
dc.contributor.authorXu, F.
dc.contributor.authorChen, X.
dc.contributor.authorMa, Y.
dc.contributor.authorPhuoc, N.N.
dc.contributor.authorZhang, X.
dc.contributor.authorOng, C.K.
dc.date.accessioned2014-10-16T09:29:08Z
dc.date.available2014-10-16T09:29:08Z
dc.date.issued2008
dc.identifier.citationXu, F., Chen, X., Ma, Y., Phuoc, N.N., Zhang, X., Ong, C.K. (2008). Influence of Si concentration on the magnetization dynamics in as-sputtered FeCoSiN thin films at high frequencies. Journal of Applied Physics 104 (8) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3005879
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/96922
dc.description.abstractIn this work, the high-frequency magnetic permeability spectra of as-sputtered FeCoSiN films with various Si concentrations were investigated. The soft magnetic properties with an induced in-plane uniaxial anisotropy can only be obtained within some composition ranges because of the formation of different granular microstructures. The permeability spectra measured without any external fields (He) were well fitted based on the phenomenological Landau-Lifshitz-Gilbert equation. Results show that with the increase in Si concentration, the saturated magnetization 4π Ms, the resonance frequency fr, the permeability μ, and the qualify factor Q values decrease, while the damping coefficient α and resonant frequency linewidth Δf increase. The increase in Gilbert damping coefficient α or G is ascribed to the increase in mosaicity or magnetic ripples with higher volume proportion of Si-rich matrix. The investigations on Δf- He relations indicate the extrinsic damping contribution from the two-magnon scattering in FeCoSiN, which is suggested to be due to the change in the granular microstructures compared with FeCoN. © 2008 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3005879
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.3005879
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume104
dc.description.issue8
dc.description.page-
dc.description.codenJAPIA
dc.identifier.isiut000260572100077
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.