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Title: Focused microprobes of high energy ions - versatile analytical probes for surfaces, interfaces and devices
Authors: Jamieson, D.N.
Bettiol, A.
Yang, C. 
Issue Date: 15-Jan-2001
Citation: Jamieson, D.N., Bettiol, A., Yang, C. (2001-01-15). Focused microprobes of high energy ions - versatile analytical probes for surfaces, interfaces and devices. Applied Surface Science 169-170 : 134-141. ScholarBank@NUS Repository.
Abstract: Today, more than 50 laboratories world-wide (including more than seven in Japan and three in Australia) apply focused microprobes of high-energy ions to a wide range of problems involving materials analysis. MeV ions penetrate deeply into matter and can therefore be used to probe and image surface and deeply buried structures. High sensitivity (ppm) trace analysis is possible from induced X-rays and backscattered particles can be used to measure stoichiometry and produce depth profiles down to about 10μm below the specimen surface. The forward recoil of hydrogen displaced by heavier ions can be used to map the hydrogen distribution. Induced charge can be collected, so images of the charge collection efficiency of the specimen can be produced. This presentation reviews recent applications of these techniques to the study of a diverse range of materials and devices including synthetic diamond, filiform corrosion tracks on aluminum, trace element contamination and charge collection efficiency in solar cells and the hydrogen distribution in solar cell material.
Source Title: Applied Surface Science
ISSN: 01694332
DOI: 10.1016/S0169-4332(00)00737-6
Appears in Collections:Staff Publications

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