Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.2749178
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dc.titleElectromigration of the conducting polymer in organic semiconductor devices and its stabilization by cross-linking
dc.contributor.authorPng, R.-Q.
dc.contributor.authorChia, P.-J.
dc.contributor.authorSivaramakrishnan, S.
dc.contributor.authorWong, L.-Y.
dc.contributor.authorZhou, M.
dc.contributor.authorChua, L.-L.
dc.contributor.authorHo, P.K.-H.
dc.date.accessioned2014-10-16T09:23:04Z
dc.date.available2014-10-16T09:23:04Z
dc.date.issued2007
dc.identifier.citationPng, R.-Q., Chia, P.-J., Sivaramakrishnan, S., Wong, L.-Y., Zhou, M., Chua, L.-L., Ho, P.K.-H. (2007). Electromigration of the conducting polymer in organic semiconductor devices and its stabilization by cross-linking. Applied Physics Letters 91 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2749178
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/96406
dc.description.abstractX-ray photoelectron spectroscopy (XPS) measurement of the ratio of poly(3,4-ethylenedioxythiophene) (PEDT) to polystyrenesulfonate (PSS) reveals accumulation of PEDT+ at the interface between the PEDT:PSSH hole-injection layer and the organic semiconductor during diode operation. This ionic drift of PEDT+ occurs even at low fields of 1 V cm-1, which will have an impact on the operational stability of the characteristics of organic light-emitting diodes. XPS and Raman spectroscopy indicate that dedoping of PEDT+ does not occur significantly in hole-only devices. Cross-linking at the 1 mol % level can stabilize the conducting polymer sufficiently against electromigration. © 2007 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.2749178
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.2749178
dc.description.sourcetitleApplied Physics Letters
dc.description.volume91
dc.description.issue1
dc.description.page-
dc.description.codenAPPLA
dc.identifier.isiut000247819700080
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