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Title: Electrical and structural characterization of the xCuO:(1-x)V2O5
Authors: Gopalakrishnan, R. 
Chowdari, B.V.R. 
Tan, K.L. 
Issue Date: Jul-1992
Citation: Gopalakrishnan, R.,Chowdari, B.V.R.,Tan, K.L. (1992-07). Electrical and structural characterization of the xCuO:(1-x)V2O5. Solid State Ionics 53-56 (PART 2) : 1168-1171. ScholarBank@NUS Repository.
Abstract: Semi-conducting glasses in the binary system xCuO:(1-x)V2Oin5 have been synthesized using the twin-roller quenching technique. The electronic conductivity (σ) of these glasses has been determined in the 295-473 K range to give a simple Arrhenius relationship. The σ has been observed to increase to a maximum value of 3.47×10-5 Ω-1 cm-1 at T=295 K with an activation energy Eact=0.38 eV for the sample with x=0.4 as the CuO content is systematically varied. The interatomic distance of vanadium atoms, calculated from density measurements, and Eact have been found to have an inverse relationship with σ. X-ray photoelectron spectroscopy (XPS) and X-ray excited Auger electron spectroscopy (XAES) investigations show that vanadium ions are present in reduced oxidation states. The proportion of vanadium ions with oxidation state 4 increases with an increase in CuO content. The electrical behavior of these glasses has been discussed in relation to the XPS and XAES data. © 1992.
Source Title: Solid State Ionics
ISSN: 01672738
Appears in Collections:Staff Publications

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