Please use this identifier to cite or link to this item:
https://doi.org/10.1063/1.1383279
DC Field | Value | |
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dc.title | Electric field-induced carbon nanotube junction formation | |
dc.contributor.author | Ho, G.W. | |
dc.contributor.author | Wee, A.T.S. | |
dc.contributor.author | Lin, J. | |
dc.date.accessioned | 2014-10-16T09:22:54Z | |
dc.date.available | 2014-10-16T09:22:54Z | |
dc.date.issued | 2001-07-09 | |
dc.identifier.citation | Ho, G.W., Wee, A.T.S., Lin, J. (2001-07-09). Electric field-induced carbon nanotube junction formation. Applied Physics Letters 79 (2) : 260-262. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1383279 | |
dc.identifier.issn | 00036951 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/96392 | |
dc.description.abstract | We present experimental evidence of nanojunction structures explicitly observed after application of high electric fields on multiwall carbon nanotube arrays. The electric field as well as thermal effects result in carbon-carbon bond breaking and redeposition leading to nanojunction formation. The growth mechanism of the nanojunction is believed to be open-ended topological defect growth in which carbon atoms at two adjacent nanotube tips chemically react and fuse forming an array of nanojunctions. © 2001 American Institute of Physics. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1383279 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | PHYSICS | |
dc.description.doi | 10.1063/1.1383279 | |
dc.description.sourcetitle | Applied Physics Letters | |
dc.description.volume | 79 | |
dc.description.issue | 2 | |
dc.description.page | 260-262 | |
dc.description.coden | APPLA | |
dc.identifier.isiut | 000169659600040 | |
Appears in Collections: | Staff Publications |
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