Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1383279
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dc.titleElectric field-induced carbon nanotube junction formation
dc.contributor.authorHo, G.W.
dc.contributor.authorWee, A.T.S.
dc.contributor.authorLin, J.
dc.date.accessioned2014-10-16T09:22:54Z
dc.date.available2014-10-16T09:22:54Z
dc.date.issued2001-07-09
dc.identifier.citationHo, G.W., Wee, A.T.S., Lin, J. (2001-07-09). Electric field-induced carbon nanotube junction formation. Applied Physics Letters 79 (2) : 260-262. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1383279
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/96392
dc.description.abstractWe present experimental evidence of nanojunction structures explicitly observed after application of high electric fields on multiwall carbon nanotube arrays. The electric field as well as thermal effects result in carbon-carbon bond breaking and redeposition leading to nanojunction formation. The growth mechanism of the nanojunction is believed to be open-ended topological defect growth in which carbon atoms at two adjacent nanotube tips chemically react and fuse forming an array of nanojunctions. © 2001 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1383279
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.1383279
dc.description.sourcetitleApplied Physics Letters
dc.description.volume79
dc.description.issue2
dc.description.page260-262
dc.description.codenAPPLA
dc.identifier.isiut000169659600040
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