Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.apsusc.2010.09.074
DC FieldValue
dc.titleEffects of post-thermal annealing temperature on the optical and structural properties of gold particles on silicon suboxide films
dc.contributor.authorChan, K.
dc.contributor.authorAspanut, Z.
dc.contributor.authorGoh, B.
dc.contributor.authorSow, C.
dc.contributor.authorVarghese, B.
dc.contributor.authorRahman, S.A.
dc.contributor.authorMuhamad, M.R.
dc.date.accessioned2014-10-16T09:22:41Z
dc.date.available2014-10-16T09:22:41Z
dc.date.issued2011-01-01
dc.identifier.citationChan, K., Aspanut, Z., Goh, B., Sow, C., Varghese, B., Rahman, S.A., Muhamad, M.R. (2011-01-01). Effects of post-thermal annealing temperature on the optical and structural properties of gold particles on silicon suboxide films. Applied Surface Science 257 (6) : 2208-2213. ScholarBank@NUS Repository. https://doi.org/10.1016/j.apsusc.2010.09.074
dc.identifier.issn01694332
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/96374
dc.description.abstractIn this work, silicon suboxide (SiOx) thin films were deposited using a RF magnetron sputtering system. A thin layer of gold (Au) with a thickness of about 10 nm was sputtered onto the surface of the deposited SiOx films prior to the thermal annealing process at 400 °C, 600 °C, 800 °C and 1000 °C. The optical and structural properties of the samples were studied using scanning electron microscopy (SEM), high-resolution transmission electron microscopy (HRTEM), X-ray diffractometry (XRD), Fourier transform infrared spectroscopy (FTIR) and optical transmission and reflection spectroscopy. SEM analyses demonstrated that the samples annealed at different temperatures produced different Au particle sizes and shapes. SiOx nanowires were found in the sample annealed at 1000 °C. Au particles induce the crystallinity of SiOx thin films in the post-thermal annealing process at different temperatures. These annealed samples produced silicon nanocrystallites with sizes of less than 4 nm, and the Au nanocrystallite sizes were in the range of 7-23 nm. With increased annealing temperature, the bond angle of the Si-O bond increased and the optical energy gap of the thin films decreased. The appearance of broad surface plasmon resonance absorption peaks in the region of 590-740 nm was observed due to the inclusion of Au particles in the samples. The results show that the position and intensity of the surface plasmon resonance peaks can be greatly influenced by the size, shape and distribution of Au particles. © 2010 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.apsusc.2010.09.074
dc.sourceScopus
dc.subjectGold particle
dc.subjectPost-thermal annealing
dc.subjectSilicon suboxide
dc.subjectSurface plasmon resonance
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1016/j.apsusc.2010.09.074
dc.description.sourcetitleApplied Surface Science
dc.description.volume257
dc.description.issue6
dc.description.page2208-2213
dc.description.codenASUSE
dc.identifier.isiut000285408700067
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

11
checked on Mar 2, 2021

WEB OF SCIENCETM
Citations

10
checked on Mar 2, 2021

Page view(s)

95
checked on Feb 28, 2021

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.