Please use this identifier to cite or link to this item: https://doi.org/10.1021/la703231h
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dc.titleEffect of tip size on force measurement in atomic force microscopy
dc.contributor.authorLim, L.T.W.
dc.contributor.authorWee, A.T.S.
dc.contributor.authorO'Shea, S.J.
dc.date.accessioned2014-10-16T09:22:22Z
dc.date.available2014-10-16T09:22:22Z
dc.date.issued2008-03-18
dc.identifier.citationLim, L.T.W., Wee, A.T.S., O'Shea, S.J. (2008-03-18). Effect of tip size on force measurement in atomic force microscopy. Langmuir 24 (6) : 2271-2273. ScholarBank@NUS Repository. https://doi.org/10.1021/la703231h
dc.identifier.issn07437463
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/96346
dc.description.abstractAn atomic force microscope (AFM) has been used to study solvation forces at the solid-liquid interface between highly oriented pyrolytic graphite (HOPG) and the liquids octamethylcyclotetrasiloxane (OMCTS), n-hexadecane (K-C9 16H34), and n-dodecanol (n-C11H 23CH2OH). Oscillatory solvation forces (F) are observed for various measured tip radii (Rtip = 15-100 nm). It is found that the normalized force data, F/Rtip, differ between AFM tips with a clear trend of decreasing F/Rtip with increasing Rtip. © 2008 American Chemical Society.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1021/la703231h
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1021/la703231h
dc.description.sourcetitleLangmuir
dc.description.volume24
dc.description.issue6
dc.description.page2271-2273
dc.description.codenLANGD
dc.identifier.isiut000253941000003
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