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|Title:||Digital IBIC - New spectroscopic modalities for ion-beam-induced charge imaging||Authors:||Sellin, P.J.
|Keywords:||Cadmium zinc telluride
Digital pulse processing
Time-resolved ion-beam-induced charge imaging
|Issue Date:||1-Apr-2004||Citation:||Sellin, P.J., Lohstroh, A., Simon, A., Breese, M.B.H. (2004-04-01). Digital IBIC - New spectroscopic modalities for ion-beam-induced charge imaging. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 521 (2-3) : 600-607. ScholarBank@NUS Repository. https://doi.org/10.1016/j.nima.2003.11.248||Abstract:||The first implementation of digital ion-beam-induced charge (IBIC) imaging is presented, which permits spectroscopic time-resolved IBIC imaging of charge transport in semiconductors. A digital IBIC system has been developed which uses a high-speed waveform digitiser to capture the pulse shapes produced by interactions of a 1μm resolution scanning microbeam in semiconductor samples. Using a variety of digital pulse shape analysis algorithms, quantitative images of charge signal amplitude, charge carrier lifetime, mobility and trapping phenomena can be acquired in real-time, with a time resolution of||Source Title:||Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment||URI:||http://scholarbank.nus.edu.sg/handle/10635/96227||ISSN:||01689002||DOI:||10.1016/j.nima.2003.11.248|
|Appears in Collections:||Staff Publications|
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