Please use this identifier to cite or link to this item: https://doi.org/10.1038/srep00442
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dc.titleDeterministic conversion between memory and threshold resistive switching via tuning the strong electron correlation
dc.contributor.authorPeng, H.Y.
dc.contributor.authorLi, Y.F.
dc.contributor.authorLin, W.N.
dc.contributor.authorWang, Y.Z.
dc.contributor.authorGao, X.Y.
dc.contributor.authorWu, T.
dc.date.accessioned2014-10-16T09:20:46Z
dc.date.available2014-10-16T09:20:46Z
dc.date.issued2012
dc.identifier.citationPeng, H.Y., Li, Y.F., Lin, W.N., Wang, Y.Z., Gao, X.Y., Wu, T. (2012). Deterministic conversion between memory and threshold resistive switching via tuning the strong electron correlation. Scientific Reports 2 : -. ScholarBank@NUS Repository. https://doi.org/10.1038/srep00442
dc.identifier.issn20452322
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/96206
dc.description.abstractIntensive investigations have been launched worldwide on the resistive switching (RS) phenomena in transition metal oxides due to both fascinating science and potential applications in next generation nonvolatile resistive random access memory (RRAM) devices. It is noteworthy that most of these oxides are strongly correlated electron systems, and their electronic properties are critically affected by the electron-electron interactions. Here, using NiO as an example, we show that rationally adjusting the stoichiometry and the associated defect characteristics enables controlled room temperature conversions between two distinct RS modes, i.e., nonvolatile memory switching and volatile threshold switching, within a single device. Moreover, from first-principles calculations and x-ray absorption spectroscopy studies, we found that the strong electron correlations and the exchange interactions between Ni and O orbitals play deterministic roles in the RS operations.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1038/srep00442
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1038/srep00442
dc.description.sourcetitleScientific Reports
dc.description.volume2
dc.description.page-
dc.identifier.isiut000305283400002
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