Please use this identifier to cite or link to this item: https://doi.org/10.1103/PhysRevB.47.9346
DC FieldValue
dc.titleDefect processes in GaP: Implications for the behavior of excited surface defects
dc.contributor.authorKhoo, G.S.
dc.contributor.authorOng, C.K.
dc.date.accessioned2014-10-16T09:20:08Z
dc.date.available2014-10-16T09:20:08Z
dc.date.issued1993
dc.identifier.citationKhoo, G.S., Ong, C.K. (1993). Defect processes in GaP: Implications for the behavior of excited surface defects. Physical Review B 47 (15) : 9346-9349. ScholarBank@NUS Repository. https://doi.org/10.1103/PhysRevB.47.9346
dc.identifier.issn01631829
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/96157
dc.description.abstractWe have investigated the different charge states and geometries of the P vacancy and Ga antisite defects in bulk GaP as well as on the GaP(110) surface. Similar behavior is observed for both the bulk and surface. The charged P vacancy VP+ exhibits symmetric outward relaxations from the vacancy site while VP0 and VP- display distortions that lower the symmetry. For the Ga antisite defect (GaP), the neutral GaP0 has a broken-bond configuration with one of its Ga nearest neighbors, while GaP- and GaP2- both have the centered configuration. However, due to their lack of symmetry, the atoms at the surface display a larger distortion. The effects of excitations initially lead to a more positive charge state of the surface defects and subsequently to bond weakening. © 1993 The American Physical Society.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1103/PhysRevB.47.9346
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1103/PhysRevB.47.9346
dc.description.sourcetitlePhysical Review B
dc.description.volume47
dc.description.issue15
dc.description.page9346-9349
dc.identifier.isiutA1993KZ50800021
Appears in Collections:Staff Publications

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