Please use this identifier to cite or link to this item:
Title: Defect plasmons using recurrence relations
Authors: Sy, H.K. 
Issue Date: 27-Mar-1995
Citation: Sy, H.K. (1995-03-27). Defect plasmons using recurrence relations. Physics Letters A 199 (3-4) : 233-240. ScholarBank@NUS Repository.
Abstract: We study the plasmons in a finite semiconductor superlattice in which there is an inner defect layer of different charge density. The solutions of the recurrence relations, obtained by matching boundary conditions, are used to obtain a general equation for the frequencies of all the modes. Numerical results are given when only the localised mode is the defect mode, and when the defect mode interacts with the two dielectric surface modes. © 1995.
Source Title: Physics Letters A
ISSN: 03759601
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

checked on Mar 29, 2020

Google ScholarTM


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.