Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.354778
DC FieldValue
dc.titleCharge trapping on different cuts of a single-crystalline α-SiO 2
dc.contributor.authorGong, H.
dc.contributor.authorLe Gressus, C.
dc.contributor.authorOh, K.H.
dc.contributor.authorDing, X.Z.
dc.contributor.authorOng, C.K.
dc.contributor.authorTan, B.T.G.
dc.date.accessioned2014-10-16T09:18:02Z
dc.date.available2014-10-16T09:18:02Z
dc.date.issued1993
dc.identifier.citationGong, H., Le Gressus, C., Oh, K.H., Ding, X.Z., Ong, C.K., Tan, B.T.G. (1993). Charge trapping on different cuts of a single-crystalline α-SiO 2. Journal of Applied Physics 74 (3) : 1944-1948. ScholarBank@NUS Repository. https://doi.org/10.1063/1.354778
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/95977
dc.description.abstractA scanning electron microscope is employed for the investigation of charging on different cuts of an α-SiO2. A method for the determination of trapped charges is proposed. Charging on different cuts is observed to decrease in the order of z cut, 30° cut, 45° cut, and 60° cut of the α-SiO2. This phenomenon is related to permittivity, defect density, and stress of the samples. Details of the experiments and the method of charge determination are given.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.354778
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.354778
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume74
dc.description.issue3
dc.description.page1944-1948
dc.identifier.isiutA1993LQ12700075
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

39
checked on Dec 1, 2021

WEB OF SCIENCETM
Citations

36
checked on Nov 24, 2021

Page view(s)

115
checked on Dec 2, 2021

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.