Please use this identifier to cite or link to this item:
https://doi.org/10.1063/1.3253420
DC Field | Value | |
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dc.title | Band offsets of HfO2 /ZnO interface: In situ x-ray photoelectron spectroscopy measurement and ab initio calculation | |
dc.contributor.author | Chen, Q. | |
dc.contributor.author | Yang, M. | |
dc.contributor.author | Feng, Y.P. | |
dc.contributor.author | Chai, J.W. | |
dc.contributor.author | Zhang, Z. | |
dc.contributor.author | Pan, J.S. | |
dc.contributor.author | Wang, S.J. | |
dc.date.accessioned | 2014-10-16T09:16:35Z | |
dc.date.available | 2014-10-16T09:16:35Z | |
dc.date.issued | 2009 | |
dc.identifier.citation | Chen, Q., Yang, M., Feng, Y.P., Chai, J.W., Zhang, Z., Pan, J.S., Wang, S.J. (2009). Band offsets of HfO2 /ZnO interface: In situ x-ray photoelectron spectroscopy measurement and ab initio calculation. Applied Physics Letters 95 (16) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3253420 | |
dc.identifier.issn | 00036951 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/95853 | |
dc.description.abstract | High quality HfO2 dielectrics have been grown on ZnO (0001) substrates. The valence- and conduction-band offsets for HfO2 /ZnO (0001) heterojunctions have been determined to be 0.14±0.05 and 2.29±0.05 eV, respectively, by using in situ x-ray photoemission spectroscopy. First-principles calculations show that the valence-band offset at the HfO2 /ZnO (0001) interface of the most energetically favorable interface structure is 0.40 eV, which is consistent with the experimental results. © 2009 American Institute of Physics. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3253420 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | PHYSICS | |
dc.description.doi | 10.1063/1.3253420 | |
dc.description.sourcetitle | Applied Physics Letters | |
dc.description.volume | 95 | |
dc.description.issue | 16 | |
dc.description.page | - | |
dc.description.coden | APPLA | |
dc.identifier.isiut | 000271218200027 | |
Appears in Collections: | Staff Publications |
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