Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1862789
DC FieldValue
dc.titleBallistic emission spectroscopy and imaging of a buried metalorganic interface
dc.contributor.authorTroadec, C.
dc.contributor.authorKunardi, L.
dc.contributor.authorChandrasekhar, N.
dc.date.accessioned2014-10-16T09:16:28Z
dc.date.available2014-10-16T09:16:28Z
dc.date.issued2005-02-14
dc.identifier.citationTroadec, C., Kunardi, L., Chandrasekhar, N. (2005-02-14). Ballistic emission spectroscopy and imaging of a buried metalorganic interface. Applied Physics Letters 86 (7) : 1-3. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1862789
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/95843
dc.description.abstractThe silverpolyparaphenylene interface is investigated using ballistic electron emission microscopy (BEEM). Multiple injection barriers and spatial nonuniformity of carrier injection over nanometer length scales are observed. No unique injection barrier is found. Physical reasons for these features are discussed. BEEM current images and the surface topography of the silver film are uncorrelated. © 2005 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1862789
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.1862789
dc.description.sourcetitleApplied Physics Letters
dc.description.volume86
dc.description.issue7
dc.description.page1-3
dc.description.codenAPPLA
dc.identifier.isiut000227439400047
Appears in Collections:Staff Publications

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