Please use this identifier to cite or link to this item: https://doi.org/10.1002/mop.23141
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dc.titleAnalysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film
dc.contributor.authorWang, P.
dc.contributor.authorTan, C.Y.
dc.contributor.authorMa, Y.G.
dc.contributor.authorCheng, W.N.
dc.contributor.authorOng, C.K.
dc.date.accessioned2014-10-16T09:15:36Z
dc.date.available2014-10-16T09:15:36Z
dc.date.issued2008-03
dc.identifier.citationWang, P., Tan, C.Y., Ma, Y.G., Cheng, W.N., Ong, C.K. (2008-03). Analysis of conductor loss in interdigital capacitor based measurement of dielectric constant of ferroelectric thin film. Microwave and Optical Technology Letters 50 (3) : 566-568. ScholarBank@NUS Repository. https://doi.org/10.1002/mop.23141
dc.identifier.issn08952477
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/95769
dc.description.abstractA procedure to include conductor loss in interdigital capacitor based dielectric constant measurements is proposed. The effect of conductor loss and contact resistance can be regarded as a series resistor connected to the interdigital capacitor. If the thickness of the conductor film is known, the conductor loss could be calculated and subtracted from the measurement results. In the frequency range where the dielectric constant of the material in test does not change with frequency, the conductor loss could also be obtained by measuring the frequency dependence of the impedance of the interdigital capacitor. © 2008 Wiley Periodicals, Inc.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1002/mop.23141
dc.sourceScopus
dc.subjectBST
dc.subjectDielectric measurements
dc.subjectFerroelectric
dc.subjectInterdigital capacitor
dc.subjectVaractor
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1002/mop.23141
dc.description.sourcetitleMicrowave and Optical Technology Letters
dc.description.volume50
dc.description.issue3
dc.description.page566-568
dc.description.codenMOTLE
dc.identifier.isiut000253106400005
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