Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1149168
DC FieldValue
dc.titleA novel approach for doping impurity in thin film insitu by dual-beam pulsed-laser deposition
dc.contributor.authorOng, C.K.
dc.contributor.authorXu, S.Y.
dc.contributor.authorZhou, W.Z.
dc.date.accessioned2014-10-16T09:14:17Z
dc.date.available2014-10-16T09:14:17Z
dc.date.issued1998
dc.identifier.citationOng, C.K., Xu, S.Y., Zhou, W.Z. (1998). A novel approach for doping impurity in thin film insitu by dual-beam pulsed-laser deposition. Review of Scientific Instruments 69 (10) : 3659-3661. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1149168
dc.identifier.issn00346748
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/95657
dc.description.abstractDoping techniques are of great importance in developing new materials and devices. We present here a novel approach for doping impurity in thin film by using dual-beam pulsed-laser deposition technique that allows insitu controlling doping under a wide range of conditions. We demonstrated doping Ag insitu in YBa2Cu3O7-δ thin films and for the first time observed long bar-like Ag structures with a length up to 150 μm in the as-deposited films, which may have important application in the fabrication of superconductor-normal metal-superconductor Josephson junctions. © 1998 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1149168
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.1149168
dc.description.sourcetitleReview of Scientific Instruments
dc.description.volume69
dc.description.issue10
dc.description.page3659-3661
dc.description.codenRSINA
dc.identifier.isiut000076430000034
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

14
checked on May 17, 2022

WEB OF SCIENCETM
Citations

19
checked on May 17, 2022

Page view(s)

269
checked on May 12, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.