Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0039-9140(97)00294-4
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dc.titleCharacterization of atomic force microscopy (AFM) tip shapes by scanning hydrothermally deposited ZnO thin films
dc.contributor.authorBao, G.W.
dc.contributor.authorLi, S.F.Y.
dc.date.accessioned2014-10-16T08:47:54Z
dc.date.available2014-10-16T08:47:54Z
dc.date.issued1998-02
dc.identifier.citationBao, G.W., Li, S.F.Y. (1998-02). Characterization of atomic force microscopy (AFM) tip shapes by scanning hydrothermally deposited ZnO thin films. Talanta 45 (4) : 751-757. ScholarBank@NUS Repository. https://doi.org/10.1016/S0039-9140(97)00294-4
dc.identifier.issn00399140
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/95443
dc.description.abstractDirect observation of tip shapes by atomic force microscopy (AFM) has been achieved using spike-like crystallites in ZnO thin films deposited on microscope glass slides by the hydrothermal deposition technique. Three types of AFM tips, e.g. standard Si3N4 tips, a broken silicon supertip and a noncontact silicon tip were examined and the acquired images for these tips show that ZnO crystallites are good samples to image commonly used AFM tips. The most obvious characteristic of this method is that it is easy for every chemical laboratory to access.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/S0039-9140(97)00294-4
dc.sourceScopus
dc.subjectAtomic force microscopy
dc.subjectTip shapes
dc.subjectZnO thin films
dc.typeConference Paper
dc.contributor.departmentCHEMISTRY
dc.description.doi10.1016/S0039-9140(97)00294-4
dc.description.sourcetitleTalanta
dc.description.volume45
dc.description.issue4
dc.description.page751-757
dc.description.codenTLNTA
dc.identifier.isiut000072165000018
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