Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/95419
DC FieldValue
dc.titleX-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films
dc.contributor.authorKim, J.S.
dc.contributor.authorHo, P.K.H.
dc.contributor.authorThomas, D.S.
dc.contributor.authorFriend, R.H.
dc.contributor.authorCacialli, F.
dc.contributor.authorBao, G.-W.
dc.contributor.authorLi, S.F.Y.
dc.date.accessioned2014-10-16T08:47:38Z
dc.date.available2014-10-16T08:47:38Z
dc.date.issued1999-12-31
dc.identifier.citationKim, J.S.,Ho, P.K.H.,Thomas, D.S.,Friend, R.H.,Cacialli, F.,Bao, G.-W.,Li, S.F.Y. (1999-12-31). X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films. Chemical Physics Letters 315 (5-6) : 307-312. ScholarBank@NUS Repository.
dc.identifier.issn00092614
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/95419
dc.description.abstractAngle-resolved X-ray photoelectron spectroscopy and photothermal deflection spectroscopy are used to study the oxygen-plasma or aquaregia treated indium-tin oxide (ITO) anodes for organic light-emitting diodes. Detailed analysis of the O1s core-level spectra and their dependence on photoemission angle was performed. The results indicate the presence of different chemical forms of oxygen atoms (two types of O2-, OH-, organic oxygens and H2O) which evolve with surface treatment. We find that the treatments lead to a modification of the surface chemical states and therefore of the physico-chemical properties of ITO, which in turn control the performance of organic light-emitting diodes.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentCHEMISTRY
dc.description.sourcetitleChemical Physics Letters
dc.description.volume315
dc.description.issue5-6
dc.description.page307-312
dc.description.codenCHPLB
dc.identifier.isiutNOT_IN_WOS
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