Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/95419
Title: X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films
Authors: Kim, J.S.
Ho, P.K.H.
Thomas, D.S.
Friend, R.H.
Cacialli, F.
Bao, G.-W.
Li, S.F.Y. 
Issue Date: 31-Dec-1999
Citation: Kim, J.S.,Ho, P.K.H.,Thomas, D.S.,Friend, R.H.,Cacialli, F.,Bao, G.-W.,Li, S.F.Y. (1999-12-31). X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films. Chemical Physics Letters 315 (5-6) : 307-312. ScholarBank@NUS Repository.
Abstract: Angle-resolved X-ray photoelectron spectroscopy and photothermal deflection spectroscopy are used to study the oxygen-plasma or aquaregia treated indium-tin oxide (ITO) anodes for organic light-emitting diodes. Detailed analysis of the O1s core-level spectra and their dependence on photoemission angle was performed. The results indicate the presence of different chemical forms of oxygen atoms (two types of O2-, OH-, organic oxygens and H2O) which evolve with surface treatment. We find that the treatments lead to a modification of the surface chemical states and therefore of the physico-chemical properties of ITO, which in turn control the performance of organic light-emitting diodes.
Source Title: Chemical Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/95419
ISSN: 00092614
Appears in Collections:Staff Publications

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