Please use this identifier to cite or link to this item:
Title: X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films
Authors: Kim, J.S.
Ho, P.K.H.
Thomas, D.S.
Friend, R.H.
Cacialli, F.
Bao, G.-W.
Li, S.F.Y. 
Issue Date: 31-Dec-1999
Citation: Kim, J.S.,Ho, P.K.H.,Thomas, D.S.,Friend, R.H.,Cacialli, F.,Bao, G.-W.,Li, S.F.Y. (1999-12-31). X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films. Chemical Physics Letters 315 (5-6) : 307-312. ScholarBank@NUS Repository.
Abstract: Angle-resolved X-ray photoelectron spectroscopy and photothermal deflection spectroscopy are used to study the oxygen-plasma or aquaregia treated indium-tin oxide (ITO) anodes for organic light-emitting diodes. Detailed analysis of the O1s core-level spectra and their dependence on photoemission angle was performed. The results indicate the presence of different chemical forms of oxygen atoms (two types of O2-, OH-, organic oxygens and H2O) which evolve with surface treatment. We find that the treatments lead to a modification of the surface chemical states and therefore of the physico-chemical properties of ITO, which in turn control the performance of organic light-emitting diodes.
Source Title: Chemical Physics Letters
ISSN: 00092614
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

checked on Nov 9, 2019

Google ScholarTM


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.