Please use this identifier to cite or link to this item:
https://doi.org/10.1039/b511981b
DC Field | Value | |
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dc.title | La2S3 thin films from metal organic chemical vapor deposition of single-source precursor | |
dc.contributor.author | Tian, L. | |
dc.contributor.author | Ouyang, T. | |
dc.contributor.author | Loh, K.P. | |
dc.contributor.author | Vittal, J.J. | |
dc.date.accessioned | 2014-10-16T08:32:26Z | |
dc.date.available | 2014-10-16T08:32:26Z | |
dc.date.issued | 2006 | |
dc.identifier.citation | Tian, L., Ouyang, T., Loh, K.P., Vittal, J.J. (2006). La2S3 thin films from metal organic chemical vapor deposition of single-source precursor. Journal of Materials Chemistry 16 (3) : 272-277. ScholarBank@NUS Repository. https://doi.org/10.1039/b511981b | |
dc.identifier.issn | 09599428 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/94128 | |
dc.description.abstract | Thin films of lanthanum sulfide (La2S3) have been prepared from [La(bipy)(S2CNEt2)3] by using metal organic chemical vapor deposition (MOCVD) on different substrates. The preparative parameters, such as substrate temperature and the nature of substrates, are optimized to get well-defined cubic phase (γ) lanthanum sulfide thin films. The optimized films are characterized by means of X-ray powder diffraction (XRPD) techniques, scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM) and in-situ X-ray photoelectron spectroscopy (XPS). © the Royal Society of Chemistry 2006. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1039/b511981b | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | CHEMISTRY | |
dc.description.doi | 10.1039/b511981b | |
dc.description.sourcetitle | Journal of Materials Chemistry | |
dc.description.volume | 16 | |
dc.description.issue | 3 | |
dc.description.page | 272-277 | |
dc.description.coden | JMACE | |
dc.identifier.isiut | 000234887700016 | |
Appears in Collections: | Staff Publications |
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