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Title: Efficient growth of ordered thin oxide films on Ni (1 1 1) by NO 2 oxidation
Authors: Yeo, B.S. 
Chen, Z.H.
Sim, W.S. 
Keywords: Auger electron spectroscopy
Infrared absorption spectroscopy
Low energy electron diffraction (LEED)
Low index single crystal surfaces
Nickel oxides
Nitrogen oxides
Issue Date: 20-May-2004
Citation: Yeo, B.S., Chen, Z.H., Sim, W.S. (2004-05-20). Efficient growth of ordered thin oxide films on Ni (1 1 1) by NO 2 oxidation. Surface Science 557 (1-3) : 201-207. ScholarBank@NUS Repository.
Abstract: The efficient growth of ordered thin oxide films on Ni(1 1 1) using low NO2 gas exposures under ultrahigh vacuum conditions has been achieved. The reaction mechanism of NO2 on Ni(1 1 1) at 500-600 K changes from total decomposition to partial dissociation into NO and O after a critical surface adatom coverage has been attained. Auger electron spectroscopy (AES) and low energy electron diffraction (LEED) reveal the creation of an intermediate NiO(1 0 0) phase, followed by the eventual formation of clean NiO(1 1 1) overlayers. Reflection absorption infrared spectroscopy (RAIRS) using CO molecules as probes of the surface adsorption sites present confirms the conversion of Ni0 to Ni2+ during the oxidation process. © 2004 Elsevier B.V. All rights reserved.
Source Title: Surface Science
ISSN: 00396028
DOI: 10.1016/j.susc.2004.03.052
Appears in Collections:Staff Publications

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