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|Title:||Frequency response and scaling of hysteresis for ferroelectric Pr(Zr0.52Ti0.48)O3 thin films deposited by laser ablation||Authors:||Liu, J.-M.
|Issue Date:||1-Nov-1999||Citation:||Liu, J.-M.,Li, H.P.,Ong, C.K.,Lim, L.C. (1999-11-01). Frequency response and scaling of hysteresis for ferroelectric Pr(Zr0.52Ti0.48)O3 thin films deposited by laser ablation. Journal of Applied Physics 86 (9) : 5198-5202. ScholarBank@NUS Repository.||Abstract:||The ferroelectric hysteresis response against periodically varying electric field over frequency range of 10-2-105 Hz and amplitude range of 2-45 kV/cm for YBa2Cu3O7 (YBCO)/ Pb(Ti0.48Zr0.52)O3 (PZT)/YBCO thin film capacitors prepared by laser ablation is measured by utilizing the Sawyer-Tower circuit. Given amplitude Δ of the field, the hysteresis area 〈A〉 first grows and then decays as a function of frequency φ. At low and high ranges of frequency, 〈A〉 can be scaled as 〈A〉 o∝φ 1/3Δ2/3 and 〈A〉∝φ-1/3A, respectively. It is established that the dynamic hysteresis at the high frequency range for a PZT thin film capacitor does not follow the theoretically predicted scaling law. An empirical scaling law 〈A〉∝φ 1/3(Δ-Δ 0)2/3/(1+bφ2/3Δ-1/3) with Δ0 the critical field and b a constant, is proposed to characterize the frequency and amplitude dependence of the hysteresis area over all the frequency range. In addition, the remnant polarization Pr and coercive field Ec as functions of φ are investigated, respectively, revealing a single-peaked pattern of both Pr and Ec. © 1999 American Institute of Physics.||Source Title:||Journal of Applied Physics||URI:||http://scholarbank.nus.edu.sg/handle/10635/92714||ISSN:||00218979|
|Appears in Collections:||Staff Publications|
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