Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/92712
DC FieldValue
dc.titleFractal-based description for the three-dimensional surface of materials
dc.contributor.authorLi, J.
dc.contributor.authorLu, L.
dc.contributor.authorSu, Y.
dc.contributor.authorLai, M.O.
dc.date.accessioned2014-10-16T03:07:41Z
dc.date.available2014-10-16T03:07:41Z
dc.date.issued1999-09
dc.identifier.citationLi, J.,Lu, L.,Su, Y.,Lai, M.O. (1999-09). Fractal-based description for the three-dimensional surface of materials. Journal of Applied Physics 86 (5) : 2526-2532. ScholarBank@NUS Repository.
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/92712
dc.description.abstractAn algorithm called variation-correlation analysis, used to estimate fractal dimension with good accuracy, has been developed. Applying this model to images of the atomic force microscope, magnetic force microscope, and scanning electron microscope, it has been demonstrated that there exists a fractal characteristic length εmax. When the scale ε is within εmax, the variation-correlation Vcor(ε) of the dimensionless field-like variable H(x,y), which may denote the height of a surface or the magnetic domain or the angle distribution, obey a power law, while when ε is over εmax, Vcor (ε) becomes constant for a given image. The concept of "fractal measure" MF is given, MF=(1-δ)/(1+δ), where δ is defined as the dispersed degree of points on a log-log plot. MF is a sort of linear measure of point distribution, which can be used to determine the fractal characteristic length. Investigation shows that the fractal dimension in the range ε
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMECHANICAL & PRODUCTION ENGINEERING
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume86
dc.description.issue5
dc.description.page2526-2532
dc.description.codenJAPIA
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.