Please use this identifier to cite or link to this item: https://doi.org/10.1103/PhysRevB.81.195316
Title: Conductance decay of a surface hydrogen tunneling junction fabricated along a Si(001)- (2×1 ) -H atomic wire
Authors: Kawai, H.
Yeo, Y.K.
Saeys, M. 
Joachim, C.
Issue Date: 18-May-2010
Citation: Kawai, H., Yeo, Y.K., Saeys, M., Joachim, C. (2010-05-18). Conductance decay of a surface hydrogen tunneling junction fabricated along a Si(001)- (2×1 ) -H atomic wire. Physical Review B - Condensed Matter and Materials Physics 81 (19) : -. ScholarBank@NUS Repository. https://doi.org/10.1103/PhysRevB.81.195316
Abstract: On a Si(001)- (2×1) -H substrate, electrons tunneling through hydrogen atomic junctions fabricated between two surface dangling-bond (DB) wires are theoretically investigated using the elastic-scattering quantum-chemistry method. The surface states introduced in the Si band gap by removing H atoms from a Si(001)- (2×1) -H surface were calculated and also analyzed using a simple tight-binding model. The two-channel surface conductance of a DB wire results from a combination of through-space and through-lattice electronic couplings between DB states. The conductance of the DB wire-H-junction-DB wire structure decreases exponentially with the length of H junction with an inverse decay rate ranging from 0.20 to 0.23 Å-1, depending on the energy. When the DB wire-H-junction-DB wire structure is contacted by Au nanoelectrodes, the transmission resonances corresponding to the DB wire states split, demonstrating a coupling of the DB wires through short surface hydrogen atomic junctions. This splitting decreases with the length of H junction between the DB wires with an inverse decay length ranging from 0.22 to 0.44 Å-1, indicating that such an atomic scale surface tunneling junction is not a very good insulator. © 2010 The American Physical Society.
Source Title: Physical Review B - Condensed Matter and Materials Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/88681
ISSN: 10980121
DOI: 10.1103/PhysRevB.81.195316
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