Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/87375
DC FieldValue
dc.titlePlanning accelerated life tests with three constant stress levels
dc.contributor.authorTang, L.-C.
dc.contributor.authorTan, A.-P.
dc.contributor.authorOng, S.-H.
dc.date.accessioned2014-10-07T10:27:26Z
dc.date.available2014-10-07T10:27:26Z
dc.date.issued2002-04-11
dc.identifier.citationTang, L.-C., Tan, A.-P., Ong, S.-H. (2002-04-11). Planning accelerated life tests with three constant stress levels. Computers and Industrial Engineering 42 (2-4) : 439-446. ScholarBank@NUS Repository.
dc.identifier.issn03608352
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/87375
dc.description.abstractThis paper presents two alternative ways of planning for constant stress accelerated tests (CSALT) with three stress levels that not only optimize the stress levels but also optimize the sample allocations. In the first method, we consider limiting the chances of inconsistency arising from non-parallel lines when data from different stress levels are plotted on the same probability plot. For the second method, we consider minimizing both the variance of some estimate and the influence arising from the addition of middle stress when the assumed stress-life relation is true. The test plan generated using the first approach is useful when one needs to establish beyond reasonable doubt that the shape parameters of the assumed Weibull distributions (or other parameters that are related to the slope of the probability plot for other distributions) at different stress levels are different. The second approach is useful when one needs to validate a particular stress-life relationship. Both approaches are formulated as constrained non-linear programs. © 2002 Elsevier Science Ltd. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/S0360-8352(02)00040-2
dc.sourceScopus
dc.subjectAccelerated life testing
dc.subjectMultiple stress levels
dc.subjectWeibull distribution
dc.typeConference Paper
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.sourcetitleComputers and Industrial Engineering
dc.description.volume42
dc.description.issue2-4
dc.description.page439-446
dc.description.codenCINDD
dc.identifier.isiut000175735300036
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.