Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/87222
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dc.titleSelecting the most reliable population under step-stress accelerated life test
dc.contributor.authorTang, L.C.
dc.contributor.authorSun, Y.
dc.date.accessioned2014-10-07T10:25:39Z
dc.date.available2014-10-07T10:25:39Z
dc.date.issued1999
dc.identifier.citationTang, L.C.,Sun, Y. (1999). Selecting the most reliable population under step-stress accelerated life test. International Journal of Reliability, Quality and Safety Engineering 6 (4) : 347-359. ScholarBank@NUS Repository.
dc.identifier.issn02185393
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/87222
dc.description.abstractWo present a method for selecting the most reliable population under step-stress accelerated life testing with typo II censoring. We construct a new statistic, the transitional order statistic (TOS), and derive an approximate expression for its distribution. Using the TOS, a selection rule is formulated from the test results. For planning purposes, we establish the relation between sample size and the probability of correct selection by defining a nonlinear indifference zone under the least favorable configuration. Finally, a simulation study is performed to illustrate the selection procedure and to validate the associated probability of correct selection. © World Scientific Publishing Company.
dc.sourceScopus
dc.subjectConstant stress
dc.subjectLeast favorable configuration
dc.subjectOrder statistic
dc.subjectReliability
dc.subjectStep stress
dc.subjectWeibull distribution
dc.typeArticle
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.sourcetitleInternational Journal of Reliability, Quality and Safety Engineering
dc.description.volume6
dc.description.issue4
dc.description.page347-359
dc.description.codenIJREF
dc.identifier.isiutNOT_IN_WOS
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