Please use this identifier to cite or link to this item: https://doi.org/10.1109/TR.2013.2255792
DC FieldValue
dc.titlePlanning accelerated life tests under scheduled inspections for log-location-scale distributions
dc.contributor.authorLiu, X.
dc.contributor.authorTang, L.-C.
dc.date.accessioned2014-10-07T10:25:03Z
dc.date.available2014-10-07T10:25:03Z
dc.date.issued2013
dc.identifier.citationLiu, X., Tang, L.-C. (2013). Planning accelerated life tests under scheduled inspections for log-location-scale distributions. IEEE Transactions on Reliability 62 (2) : 515-526. ScholarBank@NUS Repository. https://doi.org/10.1109/TR.2013.2255792
dc.identifier.issn00189529
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/87170
dc.description.abstractThis paper proposes an efficient approach to planning an ALT under scheduled inspections. We aim to simultaneously optimize stress levels, sample allocation, and inspection times for lifetimes that follow log-location-scale life distributions, including Weibull and Lognormal distributions. Such a high-dimension optimization problem is solved by a computationally efficient approach leveraging on the asymptotic equivalence between the selection of sample quantiles for parameter estimation of a location-scale distribution and the selection of the optimal inspection times during an ALT for the same purpose. A numerical example is presented to illustrate the application of the proposed approach, and a sensitivity analysis is performed to investigate the robustness of the optimal ALT plans against misspecification of planning inputs. A computer program coded in the MATLAB Graphical User Interface Design Environment is provided to make our method readily applicable in practice. © 2012 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TR.2013.2255792
dc.sourceScopus
dc.subjectAccelerated life test
dc.subjectdesign of experiments
dc.subjectoptimal spacing
dc.subjectscheduled inspections
dc.typeArticle
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.doi10.1109/TR.2013.2255792
dc.description.sourcetitleIEEE Transactions on Reliability
dc.description.volume62
dc.description.issue2
dc.description.page515-526
dc.description.codenIEERA
dc.identifier.isiut000319750500019
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