Please use this identifier to cite or link to this item:
|Title:||Planning accelerated life tests under scheduled inspections for log-location-scale distributions||Authors:||Liu, X.
|Keywords:||Accelerated life test
design of experiments
|Issue Date:||2013||Citation:||Liu, X., Tang, L.-C. (2013). Planning accelerated life tests under scheduled inspections for log-location-scale distributions. IEEE Transactions on Reliability 62 (2) : 515-526. ScholarBank@NUS Repository. https://doi.org/10.1109/TR.2013.2255792||Abstract:||This paper proposes an efficient approach to planning an ALT under scheduled inspections. We aim to simultaneously optimize stress levels, sample allocation, and inspection times for lifetimes that follow log-location-scale life distributions, including Weibull and Lognormal distributions. Such a high-dimension optimization problem is solved by a computationally efficient approach leveraging on the asymptotic equivalence between the selection of sample quantiles for parameter estimation of a location-scale distribution and the selection of the optimal inspection times during an ALT for the same purpose. A numerical example is presented to illustrate the application of the proposed approach, and a sensitivity analysis is performed to investigate the robustness of the optimal ALT plans against misspecification of planning inputs. A computer program coded in the MATLAB Graphical User Interface Design Environment is provided to make our method readily applicable in practice. © 2012 IEEE.||Source Title:||IEEE Transactions on Reliability||URI:||http://scholarbank.nus.edu.sg/handle/10635/87170||ISSN:||00189529||DOI:||10.1109/TR.2013.2255792|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.