Please use this identifier to cite or link to this item: https://doi.org/10.1109/TR.2013.2255792
Title: Planning accelerated life tests under scheduled inspections for log-location-scale distributions
Authors: Liu, X.
Tang, L.-C. 
Keywords: Accelerated life test
design of experiments
optimal spacing
scheduled inspections
Issue Date: 2013
Citation: Liu, X., Tang, L.-C. (2013). Planning accelerated life tests under scheduled inspections for log-location-scale distributions. IEEE Transactions on Reliability 62 (2) : 515-526. ScholarBank@NUS Repository. https://doi.org/10.1109/TR.2013.2255792
Abstract: This paper proposes an efficient approach to planning an ALT under scheduled inspections. We aim to simultaneously optimize stress levels, sample allocation, and inspection times for lifetimes that follow log-location-scale life distributions, including Weibull and Lognormal distributions. Such a high-dimension optimization problem is solved by a computationally efficient approach leveraging on the asymptotic equivalence between the selection of sample quantiles for parameter estimation of a location-scale distribution and the selection of the optimal inspection times during an ALT for the same purpose. A numerical example is presented to illustrate the application of the proposed approach, and a sensitivity analysis is performed to investigate the robustness of the optimal ALT plans against misspecification of planning inputs. A computer program coded in the MATLAB Graphical User Interface Design Environment is provided to make our method readily applicable in practice. © 2012 IEEE.
Source Title: IEEE Transactions on Reliability
URI: http://scholarbank.nus.edu.sg/handle/10635/87170
ISSN: 00189529
DOI: 10.1109/TR.2013.2255792
Appears in Collections:Staff Publications

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