Please use this identifier to cite or link to this item: https://doi.org/10.1108/02656719910274308
Title: Multiple response robust design and yield maximization
Authors: Jayaram, J.S.R. 
Ibrahim, Y. 
Keywords: Design
Manufacturing
Optimization
Reliability
Issue Date: 1999
Citation: Jayaram, J.S.R.,Ibrahim, Y. (1999). Multiple response robust design and yield maximization. International Journal of Quality and Reliability Management 16 (9) : 826-837. ScholarBank@NUS Repository. https://doi.org/10.1108/02656719910274308
Abstract: A design is robust if the design values for selected performance characteristics (i.e. responses) are chosen to be invariant to the variations the product will experience. For a design to be acceptable, it must conform to the design specifications. However, due to the existence of variation, this conformance is satisfied probabilistically, i.e. yield. Optimal manufacturing yield design is defined as a design that maximises the probability of satisfying the design specifications. Methods to achieve robust design for a single response and to achieve yield maximization are well established. A new method of achieving high yield and robust design for multiple responses is presented using the Cp and Cpk capability indices used in on-line quality control techniques. The proposed method is applied to a single response problem and two multiple response problems. The results showed that the proposed method is capable of producing good manufacturing yield and robust design simultaneously. © MCB University Press, 0256-671X.
Source Title: International Journal of Quality and Reliability Management
URI: http://scholarbank.nus.edu.sg/handle/10635/87089
ISSN: 0265671X
DOI: 10.1108/02656719910274308
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