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|Title:||Graphical analysis for Birnbaum-Saunders distribution||Authors:||Chang, D.S.
|Issue Date:||Jan-1994||Citation:||Chang, D.S.,Tang, L.C. (1994-01). Graphical analysis for Birnbaum-Saunders distribution. Microelectronics Reliability 34 (1) : 17-22. ScholarBank@NUS Repository.||Abstract:||The Birnbaum-Saunders distribution has been shown to be the failure time distribution for fatigue failure in particular and for stochastic wear-out failure in general. In this paper, we present a simple graphical technique, analogous to probability plotting, to estimate the parameters and check for goodness-of-fit of failure times following the Birnbaum-Saunders distribution. Using known results from regression analysis, confidence intervals for the parameters can easily be established. A salient feature of our method is that it can be used for censored data where no analytical method is available for estimation. Finally a numerical example is given to illustrate the procedure and to compare our results with that of the maximum likelihood estimation. © 1993.||Source Title:||Microelectronics Reliability||URI:||http://scholarbank.nus.edu.sg/handle/10635/87026||ISSN:||00262714|
|Appears in Collections:||Staff Publications|
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