Please use this identifier to cite or link to this item: https://doi.org/10.1109/EPTC.2006.342812
DC FieldValue
dc.titleModeling adhesive failure in electronic packages
dc.contributor.authorChew, H.B.
dc.contributor.authorGuo, T.F.
dc.contributor.authorCheng, L.
dc.date.accessioned2014-10-07T09:56:29Z
dc.date.available2014-10-07T09:56:29Z
dc.date.issued2006
dc.identifier.citationChew, H.B.,Guo, T.F.,Cheng, L. (2006). Modeling adhesive failure in electronic packages. Proceedings of the Electronic Packaging Technology Conference, EPTC : 787-792. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/EPTC.2006.342812" target="_blank">https://doi.org/10.1109/EPTC.2006.342812</a>
dc.identifier.isbn142440665X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/86931
dc.description.abstractThe numerous pores and cavities present in adhesive underfills increase the susceptibility of microelectronic packages to Type II cracking. In this work, we focus on the effects of softening-rehardening and pressure-sensitivity on adhesive failure. An axisymmetric unit-cell study is first performed to ascertain the failure mechanisms in a softening-rehardening polymer. Results show that shear banding is the dominant failure mechanism under low stress triaxiality, while internal necking is the likely failure mode for highly constrained pressure-sensitive adhesives. With this in mind, a population of discrete voids is introduced ahead of a crack in an adhesive sandwiched between elastic substrates. We show that strain softening tends to lower the stress-carrying capacity of the adhesive, while strain rehardening suppresses both the intensity and spatial extent of damage. An increase in the rate of rehardening also reduces the oblacity of the voids. For adhesives with high pressure-sensitivity, rapid voiding occurs throughout the adhesive at low loads, leading to formation of extended damage zones. © 2006 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/EPTC.2006.342812
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1109/EPTC.2006.342812
dc.description.sourcetitleProceedings of the Electronic Packaging Technology Conference, EPTC
dc.description.page787-792
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.