Please use this identifier to cite or link to this item: https://doi.org/10.1021/jp209721c
DC FieldValue
dc.titleDependence of dye-sensitized solar cell impedance on photoelectrode thickness
dc.contributor.authorJennings, J.R.
dc.contributor.authorLiu, Y.
dc.contributor.authorSafari-Alamuti, F.
dc.contributor.authorWang, Q.
dc.date.accessioned2014-10-07T09:48:30Z
dc.date.available2014-10-07T09:48:30Z
dc.date.issued2012-01-12
dc.identifier.citationJennings, J.R., Liu, Y., Safari-Alamuti, F., Wang, Q. (2012-01-12). Dependence of dye-sensitized solar cell impedance on photoelectrode thickness. Journal of Physical Chemistry C 116 (1) : 1556-1562. ScholarBank@NUS Repository. https://doi.org/10.1021/jp209721c
dc.identifier.issn19327447
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/86250
dc.description.abstractDye-sensitized solar cells with a wide range of porous TiO 2 layer thicknesses (d = 3-18 μm) have been characterized by impedance spectroscopy. Spectra were analyzed using a well-known equivalent circuit model incorporating a transmission line to obtain the distributed resistance and capacitance parameters characterizing the TiO 2 layers. No significant dependence on d was found for any of the distributed parameters, reaffirming the validity of this commonly used model. Other elements in the equivalent circuit model which represent the substrate/electrolyte, cathode/electrolyte, and FTO/TiO 2 interfaces are also examined and discussed. © 2011 American Chemical Society.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1021/jp209721c
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1021/jp209721c
dc.description.sourcetitleJournal of Physical Chemistry C
dc.description.volume116
dc.description.issue1
dc.description.page1556-1562
dc.identifier.isiut000298978700196
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.