Please use this identifier to cite or link to this item: https://doi.org/10.1111/j.1551-2916.2011.04478.x
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dc.title0.90(Na0.5Bi0.5TiO3)-0.06BaTiO 3-0.04K0.5Na0.5NbO3 ferroelectric thin films derived from chemical solutions
dc.contributor.authorKang, G.
dc.contributor.authorYao, K.
dc.contributor.authorWang, J.
dc.date.accessioned2014-10-07T09:47:29Z
dc.date.available2014-10-07T09:47:29Z
dc.date.issued2011-05
dc.identifier.citationKang, G., Yao, K., Wang, J. (2011-05). 0.90(Na0.5Bi0.5TiO3)-0.06BaTiO 3-0.04K0.5Na0.5NbO3 ferroelectric thin films derived from chemical solutions. Journal of the American Ceramic Society 94 (5) : 1331-1335. ScholarBank@NUS Repository. https://doi.org/10.1111/j.1551-2916.2011.04478.x
dc.identifier.issn00027820
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/86163
dc.description.abstract0.90(Na0.5Bi0.5TiO3)-0.06BaTiO 3-0.04K0.5Na0.5NbO3 (NBT-BT-KNN) polycrystalline ferroelectric thin films were prepared on Pt-coated silicon substrates by a chemical solution deposition method. Cracks were eliminated by reducing the residual stress and single perovskite phase was realized by eliminating pyrochlore second phase when the precursor solution was modified with polyethylene glycol (PEG). The obtained NBT-BT-KNN ferroelectric thin films exhibited a large strain of 0.22% and an effective piezoelectric coefficient d33 of 78 pm/V under the clamping of the substrate. The results indicate that the NBT-based thin films are a potential candidate as a lead-free piezoelectric material for microsystems. © 2011 The American Ceramic Society.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1111/j.1551-2916.2011.04478.x
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1111/j.1551-2916.2011.04478.x
dc.description.sourcetitleJournal of the American Ceramic Society
dc.description.volume94
dc.description.issue5
dc.description.page1331-1335
dc.identifier.isiut000290530200008
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