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|Title:||Non-destructive evaluation of compositional and property distributions in large-size relaxor single crystal wafers||Authors:||Lim, L.C.
|Issue Date:||2001||Citation:||Lim, L.C.,Kumar, F.J. (2001). Non-destructive evaluation of compositional and property distributions in large-size relaxor single crystal wafers. Proceedings of the IEEE Ultrasonics Symposium 2 : 1043-1046. ScholarBank@NUS Repository.||Abstract:||A multi-probe non-destructive evaluation technique for quantifying the distribution of Curie temperature of large-size relaxor single crystal wafers is described. The results show that through selective dicing with the aid of the proposed non-destructive test, it is possible to produce large-area (say, 20×15 mm or larger) inclusion-free lead zinc niobate-lead titanate solid-solution (or PZN-PT) single crystal wafers with a narrow TC distribution (i.e. ±1.5°C), hence of consistent composition and properties, from (001) layer growth dominated flux-grown single crystals. Typical TC variations between wafers are estimated at ± 1.5°C.||Source Title:||Proceedings of the IEEE Ultrasonics Symposium||URI:||http://scholarbank.nus.edu.sg/handle/10635/86043||ISSN:||10510117|
|Appears in Collections:||Staff Publications|
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