Please use this identifier to cite or link to this item:
Title: Growth of highly orientated 0.65Pb(Mg1/3Nb2/3)O3 -0.35PbTiO3 films by pulsed laser deposition
Authors: Zhong, X.L. 
Lu, L. 
Lai, M.O. 
Keywords: 0.65Pb (Mg1/3Nb2/3)O3-0.35PbTiO3 (PMN-PT)
LaNiO3 (LNO)
Pulsed laser deposition
Issue Date: 1-Aug-2005
Citation: Zhong, X.L., Lu, L., Lai, M.O. (2005-08-01). Growth of highly orientated 0.65Pb(Mg1/3Nb2/3)O3 -0.35PbTiO3 films by pulsed laser deposition. Surface and Coatings Technology 198 (1-3 SPEC. ISS.) : 400-405. ScholarBank@NUS Repository.
Abstract: 0.65Pb(Mg1/3Nb2/3)O3 -0.35PbTiO3 thin films (PMN-PT) on LaNiO3 (LNO) metallic oxide electrode were successfully deposited using pulsed laser deposition technique. LaAlO3 (LAO) and SiO2/Si were employed as substrates. By controlling the operating parameters, high quality with preferred orientation of growth of PMN films on LNO were successfully fabricated. XRD Bragg scan (θ-2θ) of optimized PMN-PT/LNO/SiO2/Si and PMN-PT/LNO/LAO films showed (100) and (200) peaks of the pseudocubic PMN-PT and LNO only indicating the nature of highly orientated out-of-plane texture. In-plan orientations of the films of PMN-PT/LNO/LAO were studied by φ scan, which demonstrated cube-on-cube orientation, namely, perovskite [100] ∥LNO pseudo-cubic [100]∥ LAO [100]. The crystalline quality of the (100) orientated films were examined by rocking curves of (200) reflections. The full-width at half-maximum (FWHM) value of PMN-PT on LAO substrate is 2.4°. Mechanical properties of the PMN-PT film were studied using nano-indentation technique and piezoelectric properties were characterized by a ferroelectric tester. © 2004 Elsevier B.V. All rights reserved.
Source Title: Surface and Coatings Technology
ISSN: 02578972
DOI: 10.1016/j.surfcoat.2004.10.131
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.


checked on Aug 19, 2019


checked on Aug 19, 2019

Page view(s)

checked on Aug 17, 2019

Google ScholarTM



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.