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Title: Growth of highly orientated 0.65Pb(Mg1/3Nb2/3)O3 -0.35PbTiO3 films by pulsed laser deposition
Authors: Zhong, X.L. 
Lu, L. 
Lai, M.O. 
Keywords: 0.65Pb (Mg1/3Nb2/3)O3-0.35PbTiO3 (PMN-PT)
LaNiO3 (LNO)
Pulsed laser deposition
Issue Date: 1-Aug-2005
Citation: Zhong, X.L., Lu, L., Lai, M.O. (2005-08-01). Growth of highly orientated 0.65Pb(Mg1/3Nb2/3)O3 -0.35PbTiO3 films by pulsed laser deposition. Surface and Coatings Technology 198 (1-3 SPEC. ISS.) : 400-405. ScholarBank@NUS Repository.
Abstract: 0.65Pb(Mg1/3Nb2/3)O3 -0.35PbTiO3 thin films (PMN-PT) on LaNiO3 (LNO) metallic oxide electrode were successfully deposited using pulsed laser deposition technique. LaAlO3 (LAO) and SiO2/Si were employed as substrates. By controlling the operating parameters, high quality with preferred orientation of growth of PMN films on LNO were successfully fabricated. XRD Bragg scan (θ-2θ) of optimized PMN-PT/LNO/SiO2/Si and PMN-PT/LNO/LAO films showed (100) and (200) peaks of the pseudocubic PMN-PT and LNO only indicating the nature of highly orientated out-of-plane texture. In-plan orientations of the films of PMN-PT/LNO/LAO were studied by φ scan, which demonstrated cube-on-cube orientation, namely, perovskite [100] ∥LNO pseudo-cubic [100]∥ LAO [100]. The crystalline quality of the (100) orientated films were examined by rocking curves of (200) reflections. The full-width at half-maximum (FWHM) value of PMN-PT on LAO substrate is 2.4°. Mechanical properties of the PMN-PT film were studied using nano-indentation technique and piezoelectric properties were characterized by a ferroelectric tester. © 2004 Elsevier B.V. All rights reserved.
Source Title: Surface and Coatings Technology
ISSN: 02578972
DOI: 10.1016/j.surfcoat.2004.10.131
Appears in Collections:Staff Publications

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