Please use this identifier to cite or link to this item:
Title: Distribution in orientation axis of thin film grown by pulsed laser deposition
Authors: Yu, Y.H.
Lai, M.O. 
Lu, L. 
Keywords: Crystal structure
Ferroelectric materials
Pulsed laser deposition
X-ray diffraction
Issue Date: 30-Jan-2008
Citation: Yu, Y.H., Lai, M.O., Lu, L. (2008-01-30). Distribution in orientation axis of thin film grown by pulsed laser deposition. Thin Solid Films 516 (6) : 907-911. ScholarBank@NUS Repository.
Abstract: Orientations of LaNiO3 (LNO) and Pb(Zr0.52Ti0.48)TiO3 (PZT) films deposited by laser ablation were evaluated using X-ray diffraction. (001)-oriented PZT and LNO films were achieved under optimized deposition conditions. Pole-figure measurements of both LNO and PZT films showed that (001) out-of-plan orientation was affected by plume direction. It was found that the (001) axes of both LNO and PZT films at locations away from the plume center were significantly tilted. The incline angle of tilt increases with the distance away from the center of the plume. The films grown in columnar structures and the column axis coincided with the crystalline orientation. Polarization of the PZT film was slightly affected by the difference in orientation tilt angles of the film investigated. © 2007 Elsevier B.V. All rights reserved.
Source Title: Thin Solid Films
ISSN: 00406090
DOI: 10.1016/j.tsf.2007.04.150
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.


checked on Oct 11, 2019


checked on Oct 11, 2019

Page view(s)

checked on Oct 12, 2019

Google ScholarTM



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.