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https://doi.org/10.1016/j.jcrysgro.2004.04.099
| Title: | Nanoscale cube-on-cube growth and characterization of SrS:Eu, Sm optical memory material | Authors: | Teo, K.L. Chen, C. Chong, T.C. |
Keywords: | A1. Reflection high energy electron diffraction A3. Molecular beam epitaxy B1. Sulfides B2. Semiconducting II-VI materials |
Issue Date: | 1-Aug-2004 | Citation: | Teo, K.L., Chen, C., Chong, T.C. (2004-08-01). Nanoscale cube-on-cube growth and characterization of SrS:Eu, Sm optical memory material. Journal of Crystal Growth 268 (3-4 SPEC. ISS.) : 602-606. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jcrysgro.2004.04.099 | Abstract: | We report the growth and characterization of SrS codoped with europium and samarium ions. The material was grown on (001) MgO substrate, using solid-source molecular-beam epitaxy technique. We show that the film epitaxial planes conserved the substrate surface symmetry - cubic. X-ray diffraction results establish the epitaxial relationship as cube-on-cube (001) SrS (001)MgO with [100]SrS [100] MgO for growth temperature between 400°C and 600°C. Infrared-stimulated luminescence with a peak at 612nm is observed at room temperature in SrS: Eu, Sm which is stimulated with infrared light after irradiation with visible light. © 2004 Elsevier B.V. All rights reserved. |
Source Title: | Journal of Crystal Growth | URI: | http://scholarbank.nus.edu.sg/handle/10635/83999 | ISSN: | 00220248 | DOI: | 10.1016/j.jcrysgro.2004.04.099 |
| Appears in Collections: | Staff Publications |
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