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Title: Magnetic properties of antidots in conventional and spin-reoriented antiferromagnetically coupled layers
Authors: Ranjbar, M.
Piramanayagam, S.N.
Sbiaa, R.
Chong, T.C. 
Issue Date: 1-Apr-2012
Citation: Ranjbar, M., Piramanayagam, S.N., Sbiaa, R., Chong, T.C. (2012-04-01). Magnetic properties of antidots in conventional and spin-reoriented antiferromagnetically coupled layers. Journal of Applied Physics 111 (7) : -. ScholarBank@NUS Repository.
Abstract: Antiferromagnetically coupled (AFC) patterned media technology is one approach to reduce dipolar interactions and thus minimize the switching field distribution (SFD) in bit-patterned media. Achieving anti-parallel alignment of magnetic moments at remanence requires a large exchange coupling field (H ex), especially in patterned nanostructures, which exhibit a large enhancement in coercivity after patterning. In our work, we observed a very high H ex of more than 15 kOe in Co thin film antiferromagnetically coupled to (Co/Pd) multilayers with a high perpendicular magnetic anisotropy (PMA). In contrast, an H ex of only 380 Oe was measured in the case of (Co/Pd) multilayers of the type [Co (0.4 nm)/Pd (0.8 nm)] 3 antiferromagnetically coupled with (Co/Pd) multilayers with a high PMA. The effect of H ex on SFD of patterned structures was investigated, and it was found that SFD can be reduced in AFC patterned films with a high H ex. © 2012 American Institute of Physics.
Source Title: Journal of Applied Physics
ISSN: 00218979
DOI: 10.1063/1.3679602
Appears in Collections:Staff Publications

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